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LIST OF ILLUSTRATIONS - continued
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TM-11-6625-2781-14-P-2
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SERIAL NUMBERS

TM 11-6625-2781-14&P-2
ILLUSTRATIONS (Cont'd)
Figure
Page
Figure
Page
Input Attenuator Assembly
1 MHz Crystal Oscillator, Frequency Divider
(08553-6021) Component Locations . .................8-29
and APC Compensation Circuits................................... 8-37
120 MHz Low Pass Filter A11
Preset Scan A4 (08553-6008) Connectors, Test
(08553-6001) Component Locations ...................8-29
Point Voltages and Component Locations . ................... 8-39
RF Input Attenuator Control and
Frequency Range Assembly
120 MHz Low Pass Filter . ..................................8-29
A13 (08553-60123) Adjustment and
Functional Block Diagram..........................................8-30
Component Locations.................................................... 8-39
200 MHz IF Assembly A9 (08553-6004)
Voltage Control A5 (08553-6007) Adjustments,
Component, Connections and
Test Point and Component Locations ........................... 8-39
Adjustment Locations . ........................................8-31
First LO Tuning Voltage, Marker
A9A2 (08553-6002) Component Locations ...............8-31
Generator and Frequency Range Control
A9A3 (08553-6006) Component Locations ...............8-31
Circuits . ........................................................................ 8-39
First Converter and 200 MHz IF Amplifier .................8-31
Simplifier Diagram of Second Converter................................ 8-40
200-310 MHz VTO Assembly A7
Second Converter A10
(08553-6003) Component Locations ...................8-33
(08553-60132) Component and
200-310 MHz Voltage Tuned Oscillator.....................8-33
Connector Locations...................................................... 8-41
APC Assembly A6 (08553-6010)
Second Converter .................................................................. 8-41
Component Locations..........................................8-35
Scan Width Attenuator A2 (08553-60125)
APC A6 (08553-6010) Adjustment
Test Component Locations ........................................... 8-43
Point and Connector Locations............................8-35
Scan Width Voltage Divider Circuits...................................... 8-43
Automatic Phase Control and
Bandwidth Control Circuits for IF Section .............................. 8-45
Sampler/Amplifier Circuits...................................8-35
Bandwidth Switch Al (08553-60126) Test Points .................. 8-47
Reference Assembly A8
Analogic Switching Matrix . .................................................... 8-47
(08553-60131) Component
RF Section, IF Section, Display
Locations .............................................................8-37
Section Interconnections ............................................... 8-49
TABLES
Table
Page
Table
Page
Specifications . .............................................................. 1-3
Part Numbers for Assy Exchange Orders ............................. 6-1
Supplemental Performance Characteristics................... 1-5
Reference Designators . ........................................................ 6-1
Test Equipment ............................................................. 1-7
Replaceable Parts.................................................................. 6-2
Test Accessories ........................................................... 1-8
6-4.
*Part to NSN Cross Reference . ............................................ 6-15
H01/H02 Changes to Replaceable Parts,
Display Calibration Conditions(8553B/8552A)............... 3-11
Table 6-3 . ..................................................................... 7-6
Back-Dating Serial Numbers ................................................. 7-6
Accessories and Test Equipment Required for .............
Back-Dating Changes ........................................................... 7-6
Performance Tests.................................................. 4-3
Test Equipment and Accessories List . ................................. 8-1
Analyzer Front Panel Checks . ...................................... 4-5
Out-of-Circuit Transistor Testing . ......................................... 8-4
Performance Test Record . ........................................... 4-23
Ohmmeters Used for Transistor Testing ............................... 8-4
System Test and Troubleshooting Procedure ....................... 8-14
Recommended Test Equipment .................................... 5-2
8-5.
8553B Assembly and Component Locations ......................... 8-21
Factory Selected Components....................................... 5-4
8553B Cable Connections ..................................................... 8-24
First Local Oscillator Adjustments . ............................... 5-7
8553B Plug and
Check and Adjustment Test Record.............................. 5-25
Jack Identification ......................................................... 8-25
* Part Number - National Stock Number Cross Reference Index
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