TRANSISTOR TESTING

2-9 Since certain fundamental characteristics indicate the condition of semiconductors, test equipment is available that allows you to test these characteristics with the semiconductors in or out of their circuits. Crystal-rectifier testers normally allow you to test only the forward-to-reverse current ratio of the crystal. Transistor testers, however, allow you to measure several characteristics, such as the collector leakage current (_Ic), collector to base current gain (b), and the four-terminal network parameters. The most useful test characteristic is determined by the type of circuit in which the transistor will be used. Thus, the alternating-current beta measurement is preferred for ac amplifier or oscillator applications; and for switching-circuit applications, a direct-current beta measurement may prove more useful. Many common transistors are extremely heat sensitive. Excess heat will cause the semiconductor to either fail or give intermittent operation. You have probably experienced intermittent equipment problems and know them to be both time consuming and frustrating. You know, for example, that if a problem is in fact caused by heat, simply opening the equipment during the course of troubleshooting may cause the problem to disappear. You can generally isolate the problem to the faulty printed-circuit board (pcb) by observing the fault indications. However, to further isolate the problem to a faulty component, sometimes you must apply a minimal amount of heat to the suspect pcb by carefully using a low wattage, heat shrink gun; an incandescent drop light; or a similar heating device. Be careful not to overheat the pcb. Once the fault indication reappears, you can isolate the faulty component by spraying those components suspected as being bad with a nonconductive circuit coolant, such as Freon. If the alternate heating and cooling of a component causes it to operate intermittently, you should replace it. Q-8. Name two major disadvantages of transistors. TRANSISTOR TESTING When trouble occurs in solid-state equipment, you should first check power supplies and perform voltage measurements, waveform checks, signal substitution, or signal tracing. If you isolate a faulty stage by one of these test methods, then voltage, resistance, and current measurements can be made to locate defective parts. When you make these measurements, the voltmeter impedance must be high enough that it exerts no appreciable effect upon the voltage being measured. Also, current from the ohmmeter you use must not damage the transistors. If the transistors are not soldered into the equipment, you should remove the transistors from the sockets during a resistance test. Transistors should be removed from or reinserted into the sockets only after power has been removed from the stage; otherwise damage by surge currents may result. Transistor circuits, other than pulse and power amplifier stages, are usually biased so that the emitter current is from 0.5 milliampere to 3 milliamperes and the collector voltage is from 3 to 15 volts. You can measure the emitter current by opening the emitter connector and inserting a milliammeter in series. When you make this measurement, you should expect some change in bias because of the meter resistance. You can often determine the collector current by measuring the voltage drop across a resistor in the collector circuit and calculating the current. If the transistor itself is suspected, it can be tested by one or more of the methods described below. Resistance Test You can use an ohmmeter to test transistors by measuring the emitter-collector, base-emitter, and base-collector forward and reverse resistances. A back-to-forward resistance ratio on the order of 100 to 1 or greater should be obtained for the collector-to-base and emitter-to-base measurements. The forward and reverse resistances between the emitter and collector should be nearly equal. You should make all three measurements for each transistor you test, because experience has shown that transistors can develop shorts between the collector and emitter and still have good forward and reverse resistances for the other two measurements. Because of shunting resistances in transistor circuits, you will normally have