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TESTING SEMICONDUCTOR DEVICES
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Neets Module 16-Introduction to Test Equipment
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Figure 2-15.—Testing semiconductor diodes with an oscilloscope

2-20 damage the substitute semiconductor device. If more than one defective semiconductor is present in the equipment section where trouble has been localized, the semiconductor replacement method becomes cumbersome. Several semiconductors may have to be replaced before the trouble is corrected. To determine which stage(s) failed and which semiconductors are not defective, you must test all the removed semiconductors. You can do this by observing whether the equipment operates correctly as you reinsert each of the removed semiconductor devices into the equipment. TESTING DIODES Semiconductor diodes, such as general-purpose germanium and silicon diodes, power silicon diodes, and microwave silicon diodes, can be tested effectively under actual operating conditions. However, crystal-rectifier testers are available to determine dc characteristics that provide an indication of crystal- diode quality. A common type of crystal-diode test set is a combination ohmmeter-ammeter. Measurements of forward resistance, back resistance, and reverse current can be made with this equipment. Using the results of these measurements, you can determine the relative condition of these components by comparing their measured values with typical values obtained from test information furnished with the test set or from the manufacturer’s data sheets. A check that provides a rough indication of the rectifying property of a diode is the comparison of the back-and-forward resistance of the diode at a specified voltage. A typical back-to-forward-resistance ratio is on the order of 10 to 1, and a forward-resistance value of 50 to 80 ohms is common. Q-11.   What is the typical back-to-forward resistance ratio of a good-quality diode? Testing Diodes with an Ohmmeter A convenient test for a semiconductor diode requires only an ohmmeter. The back-and-forward resistance can be measured at a voltage determined by the battery potential of the ohmmeter and the resistance range at which the meter is set. When the test leads of the ohmmeter are connected to the diode, a resistance will be measured that is different from the resistance indicated if the leads are reversed. The smaller value is called the FORWARD RESISTANCE, and the larger value is called the BACK RESISTANCE. If the ratio of back-to-forward resistance is greater than 10 to 1, the diode should be capable of functioning as a rectifier. However, keep in mind that this is a very limited test that does not take into account the action of the diode at voltages of different magnitudes and frequencies. (NOTE: This test should never be used to test crystal mixer diodes in radars. It will destroy their sensitivity.) Testing Diodes with Oscilloscopes An oscilloscope can be used to graphically display the back-and-forward resistance characteristics of a crystal diode. A circuit used in conjunction with an oscilloscope to make this test is shown in figure 2- 15. This circuit uses the oscilloscope line-test voltage as the test signal. A series circuit (composed of resistor R1 and the internal resistance in the line-test circuit) decreases a 3-volt, open-circuit test voltage to a value of approximately 2 volts peak to peak.

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