Chapter 7.GENERAL SUPPORT MAINTENANCE INSTRUCTIONS

TM 11-6625-539-14-4

CHAPTER 7

GENERAL SUPPORT MAINTENANCE INSTRUCTIONS

GENERAL

Section I.

used in this equipment because of the variables

7-1. Scope of General Support

introduced by adjustable controls and variations

caused by the devices under test.

General support maintenance personnel are au-

thorized to perform all functions allocated to them

by the maintenance allocation chart, as well as

7-3. Waveforms

any functions normally assigned to lower cate-

The only significant waveform in the equipment is

gories of maintenance.

the 1-kHz square wave output which can be

checked at the base of transistor Q1 or Q2, using

7-2. Voltage and Resistance Measurements

an oscilloscope. The square wave should have an

Significant voltage and resistance measurements

amplitude of approximately 2.5 volts peak-to-peak

are impractical for checking transistor circuits

in the BETA function.

Section Il. GENERAL SUPPORT TOOLS AND EQUIPMENT

Test Equipment Required for General Support

Table 7-1.

Maintenance-Cont.

7-4. Tools

The following electronic components:

Three hi-polar transistors which, in combination, include

No tools are required other than normal hand-

the following characteristics:

tools to perform general support maintenance on

1-PNP type

1-NPN type

the test set.

1--with beta range of 1 to 100

1--with beta range of 100 to 1000

1--with beta range of 1000 to 10,000

7-5. Test Equipment

Three field effect transistors (FET), which, in combina-

tion, include the following characteristics:

Test equipment required to perform general sup-

1--N-channel type

port maintenance of the test set is listed in table

1-P-channel type

7-1.

1--with GM range of 0 to 250

1--with GM range of 250 to 2500

1--with GM range of 2500 to 25,000

Table 7-1. Test Equipment Required for General Support

Four 1 percent tolerance resistors including:

Maintenance

1--100 ohm

Multimeter AN,/USM-223.

1--20 ohm

1--500 ohm

Ammeter ME-221/U.

1--4000 ohm

Resistor Decade ~M-16/U.

Four diodes including both silicon and germanium types.

Oscilloscope AN/281C.

GENERAL SUPPORT TROUBLESHOOTING

Section Ill.

7-6. General.

determine this by normal operation of the transis-

tor test set or by mocking up tests to check the

The test set is designed to perform a series of

function.

particular functions. These individual functions

are explained and illustrated in chapter 5. The

7-7. Fault Isolation

first step of logical troubleshooting is to determine

a. Check out the operation of the test set. If all

which functions are giving you trouble. You can

Change 1 7-1