Figure 5-7. Ico, IRfunction test circuit, simplified schematic diagram.

`TM 11-6625-539-14-4

EL6625-539-14-4-TM-10

Figure 5-7. Ico, IRfunction test circuit, simplified schematic diagram.

drive the device under test with an ac signal that

jacks, more current will flow when the function is

is free of dc component due to capacitor C8. If the

forward-biased and a resulting dc component will

be generated. The meter amplifier AR4 will force

CE jacks are connected only to a resistive device,

the signal at R36 will remain purely ac. Meter

meter M1 to deflect up scale in proportion to the

amplifier AR4 is a dc amplifier in this configura-

dc component. If the diode (PN junction) is open

tion, and no meter current will flow when an ac

or shorted, no dc component will be generated.

singal is applied.

The meter will remain at zero and will not deflect

b. If a P-N junction is placed across the C-E

into the GOOD range.

Figure 5-8. Diode in-circuit function test circuit, simplified schematic diagram.