Chapter 1. INTRODUCTION

TM 11-6625- 539- 14-4

CHAPTER 1

INTRODUCTION

Section I. GENERAL

1-1. Scope

Equipment. Maintenance forms, records, and

re-ports which are to be used by maintenance

This manual describes Test Set, Transistor

personnel at all maintenance levels are listed

TS- 1836D/U (test set) (fig. ll) and provides in-

in and prescribed by DA Pam 750-8.

structions for operation, cleaning, troubleshooting,

b. Report of Packaging and Handling

testing, aligning, and repairing the equipment. It also

Deficiencies. Fill out and forward DD Form 6

lists tools, materials, and test equipment required for

(Packaging

Improvement

Report)

organizational and general sup-port maintenance. No

prescribed in AR 735-11 -2/NAVSUP PUB

direct support maintenance is authorized for the

378/AFR 71-4/MCO P4030.29, and DSAR

equipment.

4145.8.

b. A list of references is contained in appendix A.

c. Discrepancy in Shipment Report

c. The maintenance allocation chart (MAC) ap-

(DISREP) (SF 361). Fill out and forward

pears in appendix C.

Discrepancy in Shipment Report (DISREP)

(SF 361) as prescribed in DA Pam 25-

d. Appendix D contains test data for transistors

30/NAVSUPINST 4610.33/AFM 7518/ MCO

and diodes, the testing of which is within the

P4610.19A, and DSAR 4500.15.

capability of this test set. Refer to this appendix to

determine whether test indications are within the

listed requirements for the device under test. The

1-4. Reporting of Errors

appendix is divided into separate sections for bipolar

transistors, field effect transistors, and diodes and

Report

errors,

omissions,

and

rectifiers. A separate section contains transistors

recommendations

for

improving

this

basing data which helps to identify the terminals of

publication is authorized and encouraged.

devices to be tested.

Reports should be submitted on DA Form

2028 (Recommended Changes to Publi-

1-2. Indexes of Publications

cations and Blank Forms) and forwarded

a. DA PAM 25-30 . Refer to the latest issue of DA

direct to Commander, US Army Aviation and

Missile Command, ATTN: AMSAM-MMC- MA-

Pam 25- 30 to determine whether there are new

NM, Redstone Arsenal, AL. 35898- 5000.

editions, changes, or additional publications pertaining

to the equipment.

1-5. Administrative Storage

b. DA Pam 25-30 . Refer to DA Pam 25-30 to

determine whether there are modification work orders

For procedures, forms, and records, and

(MWO's) pertaining to the equipment.

inspections required during administrative

storage of this equipment, refer to chapter 2.

1-3. Forms and Records

a. Reports of Maintenance and Unsatisfactory

1-6. Destruction of Army Materiel

Demolition and destruction of electronic

equipment will be under the direction of the

commander and in accordance with TM 750-

244-2.

Section Il. DESCRIPTION AND DATA

supply. It is designed to test transistors and

1-7. Pu rpose and Use

diodes either in circuit or out of circuit. The

Test Set, Transistor TS- 1836D/U is a portable test set

required type of test is selected by a function

Change 2

1- 1