Figure 4. METHOD FOR MAKING LOW INDUCTANCE CONNECTIONS TO TEST SIGNAL POINT DIRECTLY USING THE RF PROBE

Page Title: Figure 4. METHOD FOR MAKING LOW INDUCTANCE CONNECTIONS TO TEST SIGNAL POINT DIRECTLY USING THE RF PROBE
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Figure 2. Input Capacitance of RF Probe (Measured at 10 Mc)

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TM-11-6625-524-15-1 Voltimeter Electronic AN/URM-145 Manual

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Section III. OPERATING PROCEDURE.

METHOD FOR MAKING LOW INDUCTANCE CONNECTIONS TO TEST

SIGNAL POINT DIRECTLY USING THE RF PROBE. USE FOR

IN-CIRCUIT MEASUREMENTS WHEN LOWEST CAPACITANCE LOAD-

ING IS REQUIRED OR WHEN GROUND LEAD INDUCTANCE OF

PROBE TIP CANNOT BE TOLERATED.

AN/URM-145