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Page Title: Figure 1-30. Functional Diagram of 7-Stage Binary Counter.
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Figure   1-29.   Triple   3-Input   NAND   Gate
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TM-55-4920-401-13P Test Set Fuel Quantity Gage Capacity Type P/N 361 010 002 Manual
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Figure  1-31.  Seven-Segment  LED  Display.

TM    55-4920-401-13&P 4 .     S e v e n - S t a g e     B i n a r y     C o u n t e r is  reset  to  “zero”  by  a  high  level  on  the  reset  input. (CD4024AE).  This   counter   consists   of   an   input Each   counter   stage   is   a   static   master-slave   flip-flop. pulse   shaping   circuit,   reset   line   driver   circuitry,   and The   counter   state   is   advanced   one   count   on   the seven   binary   counter   stages   (fig.   1-30).   The   counter negative-going   transition   of   each   input   pulse. Figure   1-30.   Functional   Diagram   of   7-Stage   Binary   Counter. 5.   Seven-Segment   LED   Display   (5082- 7650).  This   is   a   large   (0.43”)   red,   common   anode, seven-segment    display    with    left-hand    decimal point.  Figure.  1-31  shows  the  schematic  and  the  con- nection  to  drive  circuitry.  Table  1-4  lists  pin  func- tions. 6.   Counter-Latch-Decoder   (MC4350L). This   device   (fig.   1-32)   combines   the   functions   of   an NBCD   counter,   four-bit   latch,   and   a   seven-segment decoder/driver.   The   counter   advances   on   input.   The serial   output   is   high   driving   the   ninth   count,   allow- ing   synchronous   or   asynchronous   counter   operation when   used   in   conjunction   with   the   enable   input   and some   external   gating.   The   counter   reset   places   the counter   in   a   non-NBCD   state,   turning   off   the   output driver   transistors   when   transferred   through   the latch   and   decoded.   This   feature   gives   automatic suppression   of   leading   zeros   in   the   display.   The latch  section  admits  information  while  the  strobe  is high   and   latches   the   data   on   the   negative   edge   of the  strobe.  A  lamp  blanking  input  is  provided  for  in- tensity   modulation,   A   lamp   test   feature   is   also available.   Circuit   operation   is   summarized   in   table 1-5. 1-31

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